- Manufacturer:
-
- Texas Instruments (29)
- onsemi (21)
- Part Status:
-
- Operating Temperature:
-
- Package / Case:
-
- Supplier Device Package:
-
- Supply Voltage:
-
- Logic Type:
-
126 Records
Image | Part | Manufacturer | Description | MOQ | Stock | Action | |
---|---|---|---|---|---|---|---|
![]() |
onsemi | IC ADDER/SUBTR DU... |
1 |
50,000
In-stock
|
Get Quote | ||
![]() |
onsemi | IC ADDER/SUBTR DU... |
1 |
50,000
In-stock
|
Get Quote | ||
![]() |
onsemi | IC DRIVER/RCVR QU... |
1 |
50,000
In-stock
|
Get Quote | ||
![]() |
Rochester Electronics | IC DRIVER/RCVR QU... |
20 |
48,600
In-stock
|
Get Quote | ||
![]() |
onsemi | IC DRIVER/RCVR DU... |
1 |
50,000
In-stock
|
Get Quote | ||
![]() |
onsemi | IC DRIVER/RCVR DU... |
1 |
50,000
In-stock
|
Get Quote | ||
![]() |
Rochester Electronics | IC FULL ADDER 4BI... |
1,031 |
130,190
In-stock
|
Get Quote | ||
![]() |
Rochester Electronics | 4-BIT FULL ADDER |
17 |
50,000
In-stock
|
Get Quote | ||
![]() |
Rochester Electronics | ADDER/SUBTRACTOR |
17 |
50,000
In-stock
|
Get Quote | ||
![]() |
Rochester Electronics | IC SCAN TEST DEVI... |
55 |
66,800
In-stock
|
Get Quote | ||
![]() |
Rochester Electronics | IC ARITHMETIC LO... |
25 |
23,100
In-stock
|
Get Quote | ||
![]() |
Texas Instruments | IC SCAN TEST DEVI... |
1 |
50,000
In-stock
|
Get Quote | ||
![]() |
Texas Instruments | IC ARITHMETIC LO... |
1 |
50,000
In-stock
|
Get Quote | ||
![]() |
Rochester Electronics | IC SCAN TEST DEVI... |
33 |
52,540
In-stock
|
Get Quote | ||
![]() |
Texas Instruments | IC SCAN TEST DEVI... |
1 |
50,000
In-stock
|
Get Quote | ||
![]() |
Rochester Electronics | IC TRANSCEIVER 1-... |
126 |
92,500
In-stock
|
Get Quote | ||
![]() |
Rochester Electronics | IC SCAN TEST DEVI... |
55 |
21,690
In-stock
|
Get Quote | ||
![]() |
Rochester Electronics | IC SCAN TEST DEVI... |
44 |
14,040
In-stock
|
Get Quote | ||
![]() |
Rochester Electronics | IC SCAN TEST DEVI... |
73 |
50,000
In-stock
|
Get Quote | ||
![]() |
Texas Instruments | IC SCAN TEST DEVI... |
1 |
50,000
In-stock
|
Get Quote |